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Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.

Bibliographic Details
Main Author:	Fallqvist, Amie.
Format:	eBook
Language:	English
Published:	Linköping : Linkopings Universitet, 2013.
Edition:	1st ed.
Series:	Linköping Studies in Science and Technology. Thesis Series
Subjects:	Electronic books.
Online Access:	Click to View

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