Fallqvist, A. (2013). Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers. Linköping: Linkopings Universitet.
Chicago Style CitationFallqvist, Amie. Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers. Linköping: Linkopings Universitet, 2013.
MLA CitationFallqvist, Amie. Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers. Linköping: Linkopings Universitet, 2013.
Warning: These citations may not always be 100% accurate.