Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.

Bibliographic Details
Main Author: Fallqvist, Amie.
Format: eBook
Language:English
Published: Linköping : Linkopings Universitet, 2013.
Edition:1st ed.
Series:Linköping Studies in Science and Technology. Thesis Series
Subjects:
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