Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance.

Bibliographic Details
Main Author: Hennen, Leonhard.
Other Authors: Hahn, Julia., Ladikas, Miltos., Lindner, Ralf., Peissl, Walter., van Est, Rinie.
Format: eBook
Language:English
Published: Cham : Springer International Publishing AG, 2023.
Edition:1st ed.
Subjects:
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