Hennen, L., Hahn, J., Ladikas, M., Lindner, R., Peissl, W., & van Est, R. (2023). Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Cham: Springer International Publishing AG.
Chicago Style CitationHennen, Leonhard., Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, and Rinie van Est. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Cham: Springer International Publishing AG, 2023.
MLA CitationHennen, Leonhard., et al. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Cham: Springer International Publishing AG, 2023.
Warning: These citations may not always be 100% accurate.