Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. - Hennen, Leonhard; Hahn, Julia; Ladikas, Miltos; Lindner, Ralf.; Peissl, Walter; van Est, Rinie (Cham : Springer International Publishing AG, 2023)
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Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2023. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
Keywords: Electronic books