Atom Probe Tomography of TiSiN Thin Films.

Bibliographic Details
Main Author: Engberg, David.
Format: eBook
Language:English
Published: Linköping : Linkopings Universitet, 2015.
Edition:1st ed.
Series:Linköping Studies in Science and Technology. Thesis Series
Subjects:
Online Access:Click to View
Description
Physical Description:1 online resource (55 pages)
ISBN:9789176859018